1

P-GRADE: A Grid Programming Environment

Year:
2003
Language:
english
File:
PDF, 1.03 MB
english, 2003
3

EU Relations with European Micro-States. Happily Ever After?

Year:
2008
Language:
english
File:
PDF, 83 KB
english, 2008
15

Extended defects in III-V semiconductor compounds

Year:
1981
Language:
english
File:
PDF, 315 KB
english, 1981
16

Selective detection of deep recombinative centers

Year:
1986
Language:
english
File:
PDF, 186 KB
english, 1986
17

Trap centers in cuprous oxide

Year:
1988
Language:
english
File:
PDF, 560 KB
english, 1988
18

Deep trap levels in cuprous oxide

Year:
1989
Language:
english
File:
PDF, 356 KB
english, 1989
19

A new method to measure fast defect transients in semiconductor and/or insulator samples

Year:
1992
Language:
english
File:
PDF, 264 KB
english, 1992
21

Designing parallel programs by the graphical language GRAPNEL

Year:
1996
Language:
english
File:
PDF, 1.70 MB
english, 1996
24

Electrical behaviour of Al/SiO2/Si structures with SiC nanocrystals

Year:
2004
Language:
english
File:
PDF, 147 KB
english, 2004
25

Migration of CrSi2 nanocrystals through nanopipes in the silicon cap

Year:
2010
Language:
english
File:
PDF, 488 KB
english, 2010
29

Effect of annealing on optical properties of thin films with β-FeSi2 quantum dots

Year:
2009
Language:
english
File:
PDF, 435 KB
english, 2009
30

Selective reactions of nucleobases under biological conditions

Year:
1977
Language:
english
File:
PDF, 248 KB
english, 1977
31

Kinetics of the reaction of pentacyanonitrosylferrate(II) with aliphatic amines

Year:
1984
Language:
english
File:
PDF, 461 KB
english, 1984
34

Space charge transients of deep level defects characterised by Auger capture

Year:
1997
Language:
english
File:
PDF, 616 KB
english, 1997
46

On the reliability of minority carrier injection DLTS spectra

Year:
1986
Language:
english
File:
PDF, 500 KB
english, 1986
48

Deep level characterization in semi-insulating LEC gallium arsenide

Year:
1988
Language:
english
File:
PDF, 574 KB
english, 1988